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Proceedings Paper

High Throughput Testing
Author(s): A. H. Marshall; R. K. Buchness; D. F. Schmunk; L. F. Vasel
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Paper Abstract

Several IFPA programs having large quantities of deliverable devices provided Rockwell with the necessity of solving the many problems associated with high volume production. The facility contains processing, assembly, and cryogenic testing equipment.

Paper Details

Date Published: 30 June 1982
PDF: 5 pages
Proc. SPIE 0311, Mosaic Focal Plane Methodologies II, (30 June 1982); doi: 10.1117/12.932810
Show Author Affiliations
A. H. Marshall, Rockwell International--Defense Electronics Operations (United States)
R. K. Buchness, Rockwell International--Defense Electronics Operations (United States)
D. F. Schmunk, Rockwell International--Defense Electronics Operations (United States)
L. F. Vasel, Rockwell International--Defense Electronics Operations (United States)


Published in SPIE Proceedings Vol. 0311:
Mosaic Focal Plane Methodologies II
William S. Chan; John T. Hall, Editor(s)

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