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Proceedings Paper

Silicon Photodiode Self-Calibration As A Basis For Radiometry In The Infrared
Author(s): Edward Zalewski; Miguel Tufino
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Paper Abstract

The recently developed, simple and highly accurate technique for self-calibration of the absolute response of a silicon photodiode is described. The silicon photodiode self-calibration (SPSC) technique is independent of both electrical substitition radiometers (ESR's) and blackbodies - the traditional standards of absolute radiometry. Using the SPSC technique one can obtain high accuracy over a limited wavelength range with a very small investment of time and money. This means that the SPSC technique can be conveniently used to calibrate an ESR, thus avoiding the long and tedious characterization measurements required to evaluate the radiant to electrical power calibration factor of an ESR. The wavelength dependence of the ESR calibration factor arises from variations in the reflectance of the coating used as a radiation absorber. By measuring the spectral variations of reflectance one can use the SPSC calibrated ESR to measure the absolute response of other detectors over a broad spectral range.

Paper Details

Date Published: 4 March 1982
PDF: 5 pages
Proc. SPIE 0308, Contemporary Infrared Standards and Calibration, (4 March 1982); doi: 10.1117/12.932760
Show Author Affiliations
Edward Zalewski, National Bureau of Standards (United States)
Miguel Tufino, Instituto Politecnico National (Mexico)


Published in SPIE Proceedings Vol. 0308:
Contemporary Infrared Standards and Calibration
Herbert Kaplan; Frederic M. Zweibaum, Editor(s)

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