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Proceedings Paper

Angle Measurements Of Scanners By Interferometry
Author(s): Jacques E. Ludman; Cardinal Warde
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Paper Abstract

A novel interferometer is described which is capable of measuring the parallelism of two faces of the same object. The use of this interferometer to compare an angle of a scanner with the angle of a reference standard is described and the results of measurements of a state-of-the-art optical scanner are given.

Paper Details

Date Published: 26 April 1982
PDF: 6 pages
Proc. SPIE 0299, Advances in Laser Scanning Technology, (26 April 1982); doi: 10.1117/12.932560
Show Author Affiliations
Jacques E. Ludman, Rome Air Development Center (United States)
Cardinal Warde, Massachusetts Institute of Technology (United States)


Published in SPIE Proceedings Vol. 0299:
Advances in Laser Scanning Technology
Leo Beiser, Editor(s)

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