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Proceedings Paper

Axial-Mode Piezoelectrically-Driven Beam Deflectors
Author(s): D. S. Randall; C. G. O'Neill
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Paper Abstract

A random-access beam scanner using axial-mode expansion of a stack of piezoelectric disks has been fabricated and tested. The measured performance was comparable to that of scanners using galvanometer or piezoelectric bimorph drivers. Computations predict that improved coupling of the stress developed by axial-mode devices can extend the performance of these devices to levels well beyond those now available.

Paper Details

Date Published: 26 April 1982
PDF: 7 pages
Proc. SPIE 0299, Advances in Laser Scanning Technology, (26 April 1982); doi: 10.1117/12.932545
Show Author Affiliations
D. S. Randall, Physics International Company (United States)
C. G. O'Neill, Physics International Company (United States)


Published in SPIE Proceedings Vol. 0299:
Advances in Laser Scanning Technology
Leo Beiser, Editor(s)

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