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Proceedings Paper

Comparison of particle sampling results from tape lifts and solvent rinses
Author(s): Joanne Egges; Genevieve Devaud; Christina M. Rockwell; Bruce A. Matheson
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Paper Abstract

Historical experience and previously published papers have shown that contamination sampling techniques influence the cleanliness results of spaceflight hardware. Programs rely on this data to show that derived or contractual requirements are met at delivery. Particle sampling using tape lifts and rinses was performed on the James Webb Space Telescope (JWST) Primary Mirror Segment Assemblies (PMSAs) hardware. Sampling was performed on identical hardware with both sampling techniques. The hardware was sampled at comparable stages of assembly which provided hardware with similar levels of particulate contamination. Results from the two sampling techniques are compared. In one technique, sampling was performed by rinsing (with a hand-squeeze bottle with low pressure) followed by a tape lift; the other technique used a tape lift only. The relationship of particle size distribution, types of particles, level of particle contamination, and particle removal rate by sampling technique are examined. Comparison of the particle sampling results provides a basis for interpreting results depending on sampling techniques. Improving the contamination engineer’s ability to interpret results is particularly useful when hardware configuration or surface finish dictate which sampling technique can be used. When one can choose the sampling technique, the results of this study can provide guidance on which technique is more appropriate depending on the circumstances. Results show that tape lifts remove more particles than low pressure rinses; furthermore that tape lift only is better than the combined operation of a rinse closely followed by a tape lift. Results also indicate that further work should be performed on different surface finishes, rinsing techniques, and particulate contamination levels.

Paper Details

Date Published: 15 October 2012
PDF: 12 pages
Proc. SPIE 8492, Optical System Contamination: Effects, Measurements, and Control 2012, 84920I (15 October 2012); doi: 10.1117/12.932461
Show Author Affiliations
Joanne Egges, Ball Aerospace & Technologies Corp. (United States)
Genevieve Devaud, Ball Aerospace & Technologies Corp. (United States)
Christina M. Rockwell, Ball Aerospace & Technologies Corp. (United States)
Bruce A. Matheson, Ball Aerospace & Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 8492:
Optical System Contamination: Effects, Measurements, and Control 2012
Sharon A. Straka; Nancy Carosso; Joanne Egges, Editor(s)

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