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Proceedings Paper

Limitations On The Use Of Root-Mean-Square (rms) Phase To Describe Beam Quality Characteristics
Author(s): Robert D. Quinnell
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Paper Abstract

A simple formula has long been in use which relates Strehl intensity of a coherent light source to the root-mean-square (RMS) of the beam phase structure for near-perfect beams: 2 I/Io = e -Φ2 RMS where I/Io is the peak for field intensity ratio and ɸRMS is the root-mean-square of the beam phase. Use of this formula has been generalized to include "power-in-a-bucket" des-criptions of far field behavior, and the tendency is to use the simple description for even larger phase distortions. With the advent of computer models, the far field intensity redistribution due to a specific near field phase structure is readily calculated. A study has been made to relate RMS phase structure to the various standards of far field: peak (Strehl) intensity, power in various "buckets", and radial dimension to capture a fixed percentage of the power. A description of Strehl intensity as a function of RMS phase has been formulated which is slightly more complex and significantly more accurate than the simple exponential currently in use.

Paper Details

Date Published: 30 December 1981
PDF: 8 pages
Proc. SPIE 0293, Wavefront Distortions in Power Optics, (30 December 1981); doi: 10.1117/12.932323
Show Author Affiliations
Robert D. Quinnell, United Technologies Research Center, Optics and Applied Technology Laboratory (United States)


Published in SPIE Proceedings Vol. 0293:
Wavefront Distortions in Power Optics
Claude A. Klein, Editor(s)

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