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Proceedings Paper

Fourier Transform Infrared Hardware Developments
Author(s): H. L. Buijs; D. J.W. Kendall; G. Vail; J.-N. Berube
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Paper Abstract

Since the last International Conference on Fourier Transform Spectroscopy considerable experience has been gained in the use of automatically aligned interferometric spectrometer systems. Features of these systems will be discussed in relation to a general purpose FTIR system with special emphasis on those areas which are most important in defining the performance of such systems. These will include alignment, phase characterization, spectral resolution, wavelength coverage, throughput and sensitivity.

Paper Details

Date Published: 29 October 1981
PDF: 9 pages
Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); doi: 10.1117/12.932204
Show Author Affiliations
H. L. Buijs, Bomem Inc. (Canada)
D. J.W. Kendall, Bomem Inc. (Canada)
G. Vail, Bomem Inc. (Canada)
J.-N. Berube, Bomem Inc. (Canada)


Published in SPIE Proceedings Vol. 0289:
1981 Intl Conf on Fourier Transform Infrared Spectroscopy
Hajime Sakai, Editor(s)

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