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Proceedings Paper

Beam Condenser-Microscope System For High Pressure Studies And General Microsampling
Author(s): J. W. Brasch; C. J. Riggle
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Paper Abstract

The development of a new, versatile beam condenser system for FT-IR spectrometers will be described. Primarily designed for use with the diamond-anvil high pressure cell, it also serves as a very convenient accessory for general microsampling. A major advantage of the system is the routine capability to visually observe the sample, using conventional optical microscopy, while the sample remains in place in the spectrometer. This adds a powerful tool to spectral studies of phase transitions, decompositions, kinetics, and distributions in microscopically heterogeneous samples. Applications of the system in high pressure studies of model lubricants will be discussed.

Paper Details

Date Published: 29 October 1981
PDF: 1 pages
Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); doi: 10.1117/12.932124
Show Author Affiliations
J. W. Brasch, Battelle Columbus Laboratories (United States)
C. J. Riggle, Battelle Columbus Laboratories (United States)

Published in SPIE Proceedings Vol. 0289:
1981 Intl Conf on Fourier Transform Infrared Spectroscopy
Hajime Sakai, Editor(s)

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