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Proceedings Paper

Continuous Wave (CW) Chemical Laser Outcoupled Beam Diagnostic System
Author(s): G. Golnik; B. D. Seery; R. W. Steffen; J. M. Brooks; J. T. Lewis; P. J. Pomphrey
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Paper Abstract

Few optical technology issues are unique to the chemical laser. However, many characteristics associated with gain medium phenomena contribute to nondiffraction-limited performance of a low pressure chemical laser and thus present interesting challenges to the optical technologist. Among these are: resonant dispersion; spatial and temporal variations in both gain and refractive index; population cascade and competition effects; polarization; high op-tical gain; complicated, nonequilibrium excitation and deexcitation kinetic processes; and large equivalent Fresnel numbers. The properties of a CW chemical laser medium and output beam are determined by a complex and interrelated series of physical processes (e.g., reac-tion chemistry, flow dynamics, mode-medium interaction, resonator mirror stability, etc.). Knowledge of these processes can be gained by utilizing the characteristic frequencies at which each occurs to decouple the effects of the various processes. Correlations between beam centroid motion (jitter) and mirror acceleration is an example. In order to make such correlations, all diagnostic measurements should be made with as much temporal bandwidth as available. This paper describes the experiments, the plan for processing the data, and the expected results from the data processing.

Paper Details

Date Published: 30 December 1981
PDF: 5 pages
Proc. SPIE 0288, Los Alamos Conf on Optics '81, (30 December 1981); doi: 10.1117/12.932086
Show Author Affiliations
G. Golnik, TRW Defense and Space Systems Group (United States)
B. D. Seery, TRW Defense and Space Systems Group (United States)
R. W. Steffen, TRW Defense and Space Systems Group (United States)
J. M. Brooks, TRW Defense and Space Systems Group (United States)
J. T. Lewis, TRW Defense and Space Systems Group (United States)
P. J. Pomphrey, TRW Defense and Space Systems Group (United States)


Published in SPIE Proceedings Vol. 0288:
Los Alamos Conf on Optics '81
Donald H. Liebenberg, Editor(s)

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