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Proceedings Paper

Contamination Simulation Facility With In Situ Infrared Analysis Capability
Author(s): David J. Carre; Paul D. Fleischauer
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Paper Abstract

A new volatile condensable materials (VCM) facility has been constructed. The facility features a unique in situ Fourier transform infrared spectrophotometric system in addition to a quartz crystal microbalance and quadrupole mass spectrometer. Contaminants can be collected and subjected to infrared spectroscopy at the collection temperature, circumventing problems associated with ex situ infrared measurements. Preliminary results indicate that VCM, with deposition thicknesses less than 200 Å, can be identified.

Paper Details

Date Published: 19 February 1982
PDF: 7 pages
Proc. SPIE 0287, Shuttle Optical Environment, (19 February 1982); doi: 10.1117/12.932014
Show Author Affiliations
David J. Carre, The Aerospace Corporation (United States)
Paul D. Fleischauer, The Aerospace Corporation (United States)

Published in SPIE Proceedings Vol. 0287:
Shuttle Optical Environment
Giovanni G. Fazio; Edgar Miller, Editor(s)

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