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Proceedings Paper

Applicability Of The Optical Transfer Function (OTF) Concept To Thermal Imaging Systems
Author(s): W. Wittenstein
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Paper Abstract

Existing standards on the optical transfer function ( OTF ) can not directly be applied to thermal imaging systems or to similar opto-electronic systems. Imaging characteristics such as a limited linear range, ac-coupling and high frequency boost or jitter, drift and flicker require more sophisticated OTF measurement techniques and a further development of the conventional OTF concept. Sampling and aliasing effects due to the raster structure of the system or to electronic multiplexing force new definitions which allow the expansion of the OTF concept to such systems. The paper gives a review of major system features that affect the OTF measurement and presents the work of an international study group that was directed toward the establishment of an OTF standard for thermal imaging systems.

Paper Details

Date Published: 29 October 1981
PDF: 8 pages
Proc. SPIE 0274, Assessment of Imaging Systems II, (29 October 1981); doi: 10.1117/12.931857
Show Author Affiliations
W. Wittenstein, Forschungsinstitut fur Optik (Federal Republic of Germany)

Published in SPIE Proceedings Vol. 0274:
Assessment of Imaging Systems II
Thomas L. Williams, Editor(s)

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