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Proceedings Paper

Contrast Sensitivity In The Assessment Of Visual Instruments
Author(s): Pantazis Mouroulis
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Paper Abstract

The application of sine-wave contrast sensitivity as an image assessment tool is examined. The required sinusoidal targets are carefully specified and the construction method is briefly described. Problems associated with the measurements are discussed and an apparatus for the subjective testing of visual instruments is presented. The method is used to investigate the best correction of astigmatism and field curvature in a telescopic system.

Paper Details

Date Published: 29 October 1981
PDF: 9 pages
Proc. SPIE 0274, Assessment of Imaging Systems II, (29 October 1981); doi: 10.1117/12.931850
Show Author Affiliations
Pantazis Mouroulis, University of Reading (United Kingdom)

Published in SPIE Proceedings Vol. 0274:
Assessment of Imaging Systems II
Thomas L. Williams, Editor(s)

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