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Proceedings Paper

Use of a flat panel display for measurement of sine condition violations
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Paper Abstract

Previous works have shown the viability of using the Sine Condition Test (SCTest) to verify the alignment of optical systems. The SCTest uses the Abbe sine condition to measure the mapping between the entrance and exit pupils of an optical system. From this pupil mapping, the linearly-field dependent aberrations can be measured and used to verify the alignment. Specifically, the linear astigmatism is used as a metric to determine how well the optical system is aligned. An advantage to using the sine condition to measure the off-axis performance is that the measurement equipment can be placed on-axis. By doing this, the uncertainty of the measurement is reduced, making this test especially useful for verifying systems with large inherent aberrations. In this paper, we expand the design space of the SCTest by exploring the two different source options: a point source with a grating or a flat-panel display. Additionally, we show experimental results of implementing the SCTest using a flat-panel display. Last, we explain how the SCTest can be implemented on more complex systems, such as a three-mirror anastigmat (TMA) and a double Gauss. By exploring the design space, we provide more design options for selecting the SCTest source, increasing the flexibility and utility of the SCTest.

Paper Details

Date Published: 15 October 2012
PDF: 11 pages
Proc. SPIE 8491, Optical System Alignment, Tolerancing, and Verification VI, 84910F (15 October 2012); doi: 10.1117/12.931720
Show Author Affiliations
Sara Lampen, College of Optical Sciences, The Univ. of Arizona (United States)
Matthew Dubin, College of Optical Sciences, The Univ. of Arizona (United States)
James H. Burge, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 8491:
Optical System Alignment, Tolerancing, and Verification VI
José Sasián; Richard N. Youngworth, Editor(s)

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