Share Email Print

Proceedings Paper

Study of bit error rate (BER) For multicarrier OFDM
Author(s): Ahmed Alshammari; Saleh Albdran; Mohammad Matin
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Orthogonal Frequency Division Multiplexing (OFDM) is a multicarrier technique that is being used more and more in recent wideband digital communications. It is known for its ability to handle severe channel conditions, the efficiency of spectral usage and the high data rate. Therefore, It has been used in many wired and wireless communication systems such as DSL, wireless networks and 4G mobile communications. Data streams are modulated and sent over multiple subcarriers using either M-QAM or M-PSK. OFDM has lower inter simple interference (ISI) levels because of the of the low data rates of carriers resulting in long symbol periods. In this paper, BER performance of OFDM with respect to signal to noise ratio (SNR) is evaluated. BPSK Modulation is used in s Simulation based system in order to get the BER over different wireless channels. These channels include additive white Gaussian Noise (AWGN) and fading channels that are based on Doppler spread and Delay spread. Plots of the results are compared with each other after varying some of the key parameters of the system such as the IFFT, number of carriers, SNR. The results of the simulation give visualization of what kind of BER to expect when the signal goes through those channels.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8498, Optics and Photonics for Information Processing VI, 849819 (15 October 2012); doi: 10.1117/12.931673
Show Author Affiliations
Ahmed Alshammari, Univ. of Denver (United States)
Saleh Albdran, Univ. of Denver (United States)
Mohammad Matin, Univ. of Denver (United States)

Published in SPIE Proceedings Vol. 8498:
Optics and Photonics for Information Processing VI
Abdul A. S. Awwal; Khan M. Iftekharuddin, Editor(s)

© SPIE. Terms of Use
Back to Top