Share Email Print
cover

Proceedings Paper

Characterization of carbon nano-materials by apertureless near-field scanning optical microscope-Raman spectroscopy
Author(s): Kyoung-Duck Park; Yong Hwan Kim; Jin Ho Park; Jung Su Park; Young-Hee Lee; Mun Seok Jeong
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this study, an apertureless near-field scanning optical microscope-Raman spectroscopy system is constructed and the topography and Raman scattering image of carbon nano-materials are simultaneously measured with high spatial resolution by using a sharp Au tip. The Rayleigh scattering image, and Raman scattering image of the carbon nanotubes showed improved spatial resolution and enhanced scattering intensity owing to the optical antenna effect of Au tip.

Paper Details

Date Published: 9 October 2012
PDF: 6 pages
Proc. SPIE 8462, Carbon Nanotubes, Graphene, and Associated Devices V, 84620J (9 October 2012); doi: 10.1117/12.931647
Show Author Affiliations
Kyoung-Duck Park, Gwangju Institute of Science and Technology (Korea, Republic of)
Yong Hwan Kim, Sungkyunkwan Univ. (Korea, Republic of)
Jin Ho Park, Gwangju Institue of Science and Technology (Korea, Republic of)
Jung Su Park, Gwangju Institue of Science and Technology (Korea, Republic of)
Young-Hee Lee, Sungkyunkwan Univ. (Korea, Republic of)
Mun Seok Jeong, Gwangju Institute of Science and Technology (Korea, Republic of)


Published in SPIE Proceedings Vol. 8462:
Carbon Nanotubes, Graphene, and Associated Devices V
Didier Pribat; Young-Hee Lee; Manijeh Razeghi, Editor(s)

© SPIE. Terms of Use
Back to Top