Share Email Print
cover

Proceedings Paper

Focus ion beam milling and 3-dimension image reconstruction to study sub-surface morphology of electrospun CNT composites
Author(s): Eva M. Campo
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Details

Date Published:
PDF
Proc. SPIE 8463, Nanoengineering: Fabrication, Properties, Optics, and Devices IX, 846312; doi: 10.1117/12.931242
Show Author Affiliations
Eva M. Campo, Univ. of Pennsylvania (United States)


Published in SPIE Proceedings Vol. 8463:
Nanoengineering: Fabrication, Properties, Optics, and Devices IX
Elizabeth A. Dobisz; Louay A. Eldada, Editor(s)

© SPIE. Terms of Use
Back to Top