Share Email Print
cover

Proceedings Paper

The distance dependences and spatial uniformities of spectral irradiance standard lamps
Author(s): Howard W. Yoon; Gary D. Graham; Robert D. Saunders; Yuqin Zong; Eric L. Shirley
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We describe the characterization of a group of NIST spectral irradiance lamps at longer distances and larger angles than are typically issued by NIST. The spectral irradiances from the FEL lamps were measured from 50 cm to 150 cm at 8 different distances using a cosine-corrected filter radiometer to determine if the lamps adhere to the inverse square law. Using the filter radiometer, the spatial uniformities of the FEL lamps were also mapped over a 20 cm square area at 135 cm, 143 cm and 151 cm. In the NIST gonio-spectroradiometer facility, selected lamps were also mapped for the angular dependences of the spectral irradiances at a distance of 123 cm using a spectrograph which measures from 300 nm to 1100 nm for comparisons to the filter radiometer measurements. Using these measurements, an uncertainty budget for the distance and the angular uniformity correction of the FEL lamps was developed.

Paper Details

Date Published: 19 October 2012
PDF: 13 pages
Proc. SPIE 8510, Earth Observing Systems XVII, 85100D (19 October 2012); doi: 10.1117/12.930800
Show Author Affiliations
Howard W. Yoon, National Institute of Standards and Technology (United States)
Gary D. Graham, ITT Geospatial Systems Division, LLC (United States)
Robert D. Saunders, National Institute of Standards and Technology (United States)
Yuqin Zong, National Institute of Standards and Technology (United States)
Eric L. Shirley, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 8510:
Earth Observing Systems XVII
James J. Butler; Xiaoxiong Xiong; Xingfa Gu, Editor(s)

© SPIE. Terms of Use
Back to Top