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Proceedings Paper

Development of diffraction-amalgamated grain-boundary tracking technique and its application to polycrystalline metals
Author(s): Hiroyuki Toda; Darren LeClere; Takanobu Kamiko; Yoshio Suzuki; Akihisa Takeuchi; Kentaro Uesugi; Masakazu Kobayashi
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Paper Abstract

By amalgamating a transmission X-Ray diffraction (XRD) experiment with grain boundary tracking (GBT) that has been developed by the present authors by combining the X-ray micro-tomography (CT) and the gallium-enhanced grain boundary visualization techniques, a novel method which provides accurate crystallographic information of individual grains during deformation has been created. The developed technique, which is called diffraction-amalgamated grain boundary tracking (DAGT) technique, is non-destructive for in-situ characterizing of bulk materials, which allows for close to deformation and fracture analysis of metals. Employing near field XRD analysis with a thin collimated X-ray beam, the algorithms developed for DAGT identifies which diffraction spots are related to which grain; consequently, providing a description of the misorientation between grains. DAGT also realizes micron-level analysis of grain morphologies and local stain distribution in 3-dimensions (3D) on the basis of CT observation, enabling the crystallographic interpretation of localized deformation without being affected by blurring of diffraction spots caused by deformation. An Al-3mass%Cu alloy was used for demonstration purpose.

Paper Details

Date Published: 17 October 2012
PDF: 8 pages
Proc. SPIE 8506, Developments in X-Ray Tomography VIII, 85060B (17 October 2012); doi: 10.1117/12.930608
Show Author Affiliations
Hiroyuki Toda, Toyohashi Univ. of Technology (Japan)
Darren LeClere, Toyohashi Univ. of Technology (Japan)
Takanobu Kamiko, Toyohashi Univ. of Technology (Japan)
Yoshio Suzuki, Japan Synchrotron Research Institute (Japan)
Akihisa Takeuchi, Japan Synchrotron Research Institute (Japan)
Kentaro Uesugi, Japan Synchrotron Research Institute (Japan)
Masakazu Kobayashi, Toyohashi Univ. of Technology (Japan)

Published in SPIE Proceedings Vol. 8506:
Developments in X-Ray Tomography VIII
Stuart R. Stock, Editor(s)

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