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Proceedings Paper

A fast and accurate surface plasmon resonance system
Author(s): Y. M. Espinosa Sánchez; D. Luna Moreno; E. Noé Arias; G. Garnica Campos
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Paper Abstract

In this work we propose a Surface Plasmon Resonance (SPR) system driven by Labview software which produces a fast, simple and accuracy measurements of samples. The system takes 2000 data in a range of 20 degrees in 20 seconds and 0.01 degrees of resolution. All the information is sent from the computer to the microcontroller as an array of bytes in hexadecimal format to be analyzed. Besides to using the system in SPR measurement is possible to make measurement of the critic angle, and Brewster angle using the Abeles method.

Paper Details

Date Published: 15 October 2012
PDF: 6 pages
Proc. SPIE 8495, Reflection, Scattering, and Diffraction from Surfaces III, 849518 (15 October 2012); doi: 10.1117/12.930315
Show Author Affiliations
Y. M. Espinosa Sánchez, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
D. Luna Moreno, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
E. Noé Arias, Ctr. de Investigaciones en Óptica, A.C. (Mexico)
G. Garnica Campos, Ctr. de Investigaciones en Óptica, A.C. (Mexico)


Published in SPIE Proceedings Vol. 8495:
Reflection, Scattering, and Diffraction from Surfaces III
Leonard M. Hanssen, Editor(s)

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