Share Email Print
cover

Proceedings Paper

X-ray micro-tomography at the Advanced Light Source
Author(s): A. A. MacDowell; D. Y. Parkinson; A. Haboub; E. Schaible; J. R. Nasiatka; C. A. Yee; J. R. Jameson; J. B. Ajo-Franklin; C. R. Brodersen; A. J. McElrone
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The X-ray micro-Tomography Facility at the Advanced Light Source has been in operation since 2004. The source is a superconducting bend magnet of critical energy 11.5 keV; photon energy coverage is 8-45 KeV in monochromatic mode, and a filtered white light option yields useful photons up to 50 keV. A user-friendly graphical user interface allows users to collect tomographic and radiographic data sets with options including tiled and time series data sets. We will focus on recent projects that utilize sample environments for in-situ imaging. These environments include a high pressure triaxial flow cell which has allowed study of supercritical CO2 transport through brine-saturated sandstone at pressures typical of in-situ conditions for subsurface CO2 sequestration and water transportation within live plants.

Paper Details

Date Published: 17 October 2012
PDF: 14 pages
Proc. SPIE 8506, Developments in X-Ray Tomography VIII, 850618 (17 October 2012); doi: 10.1117/12.930243
Show Author Affiliations
A. A. MacDowell, Lawrence Berkeley National Lab. (United States)
D. Y. Parkinson, Lawrence Berkeley National Lab. (United States)
A. Haboub, Lawrence Berkeley National Lab. (United States)
E. Schaible, Lawrence Berkeley National Lab. (United States)
J. R. Nasiatka, Lawrence Berkeley National Lab. (United States)
C. A. Yee, Lawrence Berkeley National Lab. (United States)
J. R. Jameson, Lawrence Berkeley National Lab. (United States)
J. B. Ajo-Franklin, Lawrence Berkeley National Lab. (United States)
C. R. Brodersen, Univ of Florida (United States)
A. J. McElrone, Univ. of California, Davis (United States)


Published in SPIE Proceedings Vol. 8506:
Developments in X-Ray Tomography VIII
Stuart R. Stock, Editor(s)

© SPIE. Terms of Use
Back to Top