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Proceedings Paper

Diffraction effects for interferometric measurements due to imaging aberrations
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Paper Abstract

Aspheric surfaces are often measured using interferometers with null correctors. The null corrector creates a wavefront that matches the surface under test, but also introduces imaging aberrations, such as mapping distortion and field curvature. These imaging aberrations cause high frequency features in the surface under test to be filtered out and create artifacts at edges. We provide a concise methodology for analyzing these effects using field curvatures, and showing how they couple with diffraction as represented by the Talbot effect and Fresnel edge diffraction.

Paper Details

Date Published: 13 September 2012
PDF: 11 pages
Proc. SPIE 8493, Interferometry XVI: Techniques and Analysis, 84930D (13 September 2012); doi: 10.1117/12.930104
Show Author Affiliations
Ping Zhou, College of Optical Sciences, The Univ. of Arizona (United States)
Chunyu Zhao, College of Optical Sciences, The Univ. of Arizona (United States)
James Burge, College of Optical Sciences, The Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 8493:
Interferometry XVI: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers; Jan Burke, Editor(s)

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