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Proceedings Paper

Profiling structured beams using injected aerosols
Author(s): N. Duane Loh; Dmitri Starodub; Lukas Lomb; Christina Y. Hampton; Andrew V. Martin; Raymond G. Sierra; Anton Barty; Andrew Aquila; Joachim Schulz; Jan Steinbrener; Robert L. Shoeman; Stephan Kassemeyer; Christoph Bostedt; John Bozek; Sascha W. Epp; Benjamin Erk; Robert Hartmann; Daniel Rolles; Artem Rudenko; Benedikt Rudek; Lutz Foucar; Nils Kimmel; Georg Weidenspointner; Günther Hauser; Peter Holl; Emanuele Pedersoli; MengNing Liang; Mark S. Hunter; Lars Gumprecht; Nicola Coppola; Cornelia Wunderer; Heinz Graafsman; Filipe R. N. C. Maia; Tomas Ekeberg; Max Hantke; Holger Fleckenstein; Helmut Hirsemann; Karol Nass; Thomas A. White; Herbert J. Tobias; George R. Farquar; W. Henry Benner; Stefan Hau-Riege; Christian Reich; Andreas Hartmann; Heike Soltau; Stefano Marchesini; Sasa Bajt; Miriam Barthelmess; Lothar Strueder; Joachim Ullrich; Philip Bucksbaum; Keith O. Hodgson; Mathias Frank; Ilme Schlichting; Henry N. Chapman; Michael J. Bogan
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Paper Abstract

Profiling structured beams produced by X-ray free-electron lasers (FELs) is crucial to both maximizing signal intensity for weakly scattering targets and interpreting their scattering patterns. Earlier ablative imprint studies describe how to infer the X-ray beam profile from the damage that an attenuated beam inflicts on a substrate. However, the beams in-situ profile is not directly accessible with imprint studies because the damage profile could be different from the actual beam profile. On the other hand, although a Shack-Hartmann sensor is capable of in-situ profiling, its lenses may be quickly damaged at the intense focus of hard X-ray FEL beams. We describe a new approach that probes the in-situ morphology of the intense FEL focus. By studying the translations in diffraction patterns from an ensemble of randomly injected sub-micron latex spheres, we were able to determine the non-Gaussian nature of the intense FEL beam at the Linac Coherent Light Source (SLAC National Laboratory) near the FEL focus. We discuss an experimental application of such a beam-profiling technique, and the limitations we need to overcome before it can be widely applied.

Paper Details

Date Published: 19 October 2012
PDF: 10 pages
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850403 (19 October 2012); doi: 10.1117/12.930075
Show Author Affiliations
N. Duane Loh, SLAC National Accelerator Lab. (United States)
Dmitri Starodub, SLAC National Accelerator Lab. (United States)
Lukas Lomb, Max-Planck-Institut für medizinische Forschung (Germany)
Christina Y. Hampton, SLAC National Accelerator Lab. (United States)
Andrew V. Martin, Deutsches Elektronen-Synchrotron (Germany)
Raymond G. Sierra, SLAC National Accelerator Lab. (United States)
Anton Barty, Deutsches Elektronen-Synchrotron (Germany)
Andrew Aquila, European XFEL GmbH (Germany)
Joachim Schulz, European XFEL GmbH (Germany)
Jan Steinbrener, Max-Planck-Institut für medizinische Forschung (Germany)
Robert L. Shoeman, Max-Planck-Institut für medizinische Forschung (Germany)
Stephan Kassemeyer, Max-Planck-Institut für medizinische Forschung (Germany)
Christoph Bostedt, SLAC National Accelerator Lab. (United States)
John Bozek, SLAC National Accelerator Lab. (United States)
Sascha W. Epp, Max-Planck-Arbeitsgruppen für strukturelle Molekularbiologie (Germany)
Benjamin Erk, Max-Planck-Arbeitsgruppen für strukturelle Molekularbiologie (Germany)
Robert Hartmann, PNSensor GmbH (Germany)
Daniel Rolles, Max-Planck-Arbeitsgruppen für strukturelle Molekularbiologie (Germany)
Artem Rudenko, Max-Planck-Arbeitsgruppen für strukturelle Molekularbiologie (Germany)
Benedikt Rudek, Max-Planck-Arbeitsgruppen für strukturelle Molekularbiologie (Germany)
Lutz Foucar, Max-Planck-Arbeitsgruppen für strukturelle Molekularbiologie (Germany)
Nils Kimmel, Max-Planck-Institut Halbleiterlabor (Germany)
Georg Weidenspointner, Max-Planck-Institut Halbleiterlabor (Germany)
Günther Hauser, Max-Planck-Institut Halbleiterlabor (Germany)
Peter Holl, PNSensor GmbH (Germany)
Emanuele Pedersoli, Sincrotrone Trieste S.C.p.A. (Italy)
MengNing Liang, Deutsches Elektronen-Synchrotron (Germany)
Mark S. Hunter, Lawrence Livermore National Lab. (United States)
Lars Gumprecht, Deutsches Elektronen-Synchrotron (Germany)
Nicola Coppola, European XFEL GmbH (Germany)
Cornelia Wunderer, Deutsches Elektronen-Synchrotron (Germany)
Heinz Graafsman, Deutsches Elektronen-Synchrotron (Germany)
Filipe R. N. C. Maia, Lawrence Berkeley National Lab. (United States)
Tomas Ekeberg, Uppsala Univ. (Sweden)
Max Hantke, Uppsala Univ. (Sweden)
Holger Fleckenstein, Deutsches Elektronen-Synchrotron (Germany)
Helmut Hirsemann, H. Hirsemann, (Germany)
Karol Nass, Deutsches Elektronen-Synchrotron (Germany)
Thomas A. White, Deutsches Elektronen-Synchrotron (Germany)
Herbert J. Tobias, Cornell Univ. (United States)
George R. Farquar, Lawrence Livermore National Lab. (United States)
W. Henry Benner, Lawrence Livermore National Lab. (United States)
Stefan Hau-Riege, Lawrence Livermore National Lab. (United States)
Christian Reich, PNSensor GmbH (Germany)
Andreas Hartmann, PNSensor GmbH (Germany)
Heike Soltau, PNSensor GmbH (Germany)
Stefano Marchesini, Lawrence Berkeley National Lab. (United States)
Sasa Bajt, Deutsches Elektronen-Synchrotron (Germany)
Miriam Barthelmess, Deutsches Elektronen-Synchrotron (Germany)
Lothar Strueder, Max-Planck-Institut Halbleiterlabor (Germany)
Joachim Ullrich, Max-Planck-Institut für Kernphysik (Germany)
Philip Bucksbaum, SLAC National Accelerator Lab. (United States)
Keith O. Hodgson, SLAC National Accelerator Lab. (United States)
Mathias Frank, Lawrence Livermore National Lab. (United States)
Ilme Schlichting, Max-Planck-Institut für medizinische Forschung (Germany)
Henry N. Chapman, Deutsches Elektronen-Synchrotron (Germany)
Michael J. Bogan, SLAC National Accelerator Lab. (United States)


Published in SPIE Proceedings Vol. 8504:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Stefan P. Moeller; Makina Yabashi; Stefan P. Hau-Riege, Editor(s)

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