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Proceedings Paper

Interferometer inspection of local defect type Young-Chalmers
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Paper Abstract

Using the analogy of the double-slit experiment developed by Young and using interferometric technique developed by Chalmers, we built an interferometric arrangement that can analyze local defects of an optical surface. With a reflective spatial light modulator (RSLM) controlled by a PC, two apertures are open each time, and the apertures became as secondary light sources, producing interference pattern for specific zones for the surface under test. The interference pattern is observed, and storage into a computer by using a CCD camera. Finally the results are compared with the results obtained using a Fizeau commercial interferometer.

Paper Details

Date Published: 13 September 2012
PDF: 7 pages
Proc. SPIE 8494, Interferometry XVI: Applications, 84940O (13 September 2012); doi: 10.1117/12.930049
Show Author Affiliations
Benito Canales-Pacheco, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Alejandro Cornejo-Rodriguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Fermín Granados-Agustin, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Esteban Rueda-Soriano, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
Pedro Cebrian-Xochihuila, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)


Published in SPIE Proceedings Vol. 8494:
Interferometry XVI: Applications
Cosme Furlong; Christophe Gorecki; Erik L. Novak, Editor(s)

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