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Proceedings Paper

Recent advances in the reliability of OTFTs
Author(s): Patrick Too; Herve Vandekerckhove; Guillaume Fichet; M. James Harding; Michael J. Banach
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Paper Abstract

In this paper, we present the results of achieving stable organic thin film transistors (OTFTs) under bias stress conditions. We discuss the various factors that have been found to influence the operational stability of the OTFT. This has enabled Plastic Logic to achieve a reliable active matrix backplane on low cost flexible substrates which is a key enabler for electronic paper displays.

Paper Details

Date Published: 11 October 2012
PDF: 5 pages
Proc. SPIE 8478, Organic Field-Effect Transistors XI, 847807 (11 October 2012); doi: 10.1117/12.930013
Show Author Affiliations
Patrick Too, Plastic Logic Ltd. (United Kingdom)
Herve Vandekerckhove, Plastic Logic Ltd. (United Kingdom)
Guillaume Fichet, Plastic Logic Ltd. (United Kingdom)
M. James Harding, Plastic Logic Ltd. (United Kingdom)
Michael J. Banach, Plastic Logic Ltd. (United Kingdom)


Published in SPIE Proceedings Vol. 8478:
Organic Field-Effect Transistors XI
Zhenan Bao; Iain McCulloch, Editor(s)

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