Share Email Print
cover

Proceedings Paper

An efficient and novel computation method for simulating diffraction patterns from large-scale coded apertures on large-scale focal plane arrays
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A novel and memory efficient method for computing diffraction patterns produced on large-scale focal planes by largescale Coded Apertures at wavelengths where diffraction effects are significant has been developed and tested. The scheme, readily implementable on portable computers, overcomes the memory limitations of present state-of-the-art simulation codes such as Zemax. The method consists of first calculating a set of reference complex field (amplitude and phase) patterns on the focal plane produced by a single (reference) central hole, extending to twice the focal plane array size, with one such pattern for each Line-of-Sight (LOS) direction and wavelength in the scene, and with the pattern amplitude corresponding to the square-root of the spectral irradiance from each such LOS direction in the scene at selected wavelengths. Next the set of reference patterns is transformed to generate pattern sets for other holes. The transformation consists of a translational pattern shift corresponding to each hole’s position offset and an electrical phase shift corresponding to each hole’s position offset and incoming radiance’s direction and wavelength. The set of complex patterns for each direction and wavelength is then summed coherently and squared for each detector to yield a set of power patterns unique for each direction and wavelength. Finally the set of power patterns is summed to produce the full waveband diffraction pattern from the scene. With this tool researchers can now efficiently simulate diffraction patterns produced from scenes by large-scale Coded Apertures onto large-scale focal plane arrays to support the development and optimization of coded aperture masks and image reconstruction algorithms.

Paper Details

Date Published: 15 October 2012
PDF: 21 pages
Proc. SPIE 8520, Unconventional Imaging and Wavefront Sensing 2012, 852007 (15 October 2012); doi: 10.1117/12.929922
Show Author Affiliations
Abraham Shrekenhamer, Consultant (United States)
Stephen R. Gottesman, Northrop Grumman Electronic Systems (United States)


Published in SPIE Proceedings Vol. 8520:
Unconventional Imaging and Wavefront Sensing 2012
Jean J. Dolne; Thomas J. Karr; Victor L. Gamiz, Editor(s)

© SPIE. Terms of Use
Back to Top