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Proceedings Paper

Electrical bias as an alternate method for reproducible measurement of copper indium gallium diselenide (CIGS) photovoltaic modules
Author(s): Chris Deline; Adam Stokes; Timothy J. Silverman; Steve Rummel; Dirk Jordan; Sarah Kurtz
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Paper Abstract

Light-to-dark metastable changes in thin-film photovoltaic (PV) modules can introduce uncertainty when measuring module performance on indoor flash testing equipment. This study describes a method to stabilize module performance through forward-bias current injection rather than light exposure. Measurements of five pairs of thin-film copper indium gallium diselenide (CIGS) PV modules indicate that forward-bias exposure maintained the PV modules at a stable condition (within 1%) while the unbiased modules degraded in performance by up to 12%. It was also found that modules exposed to forward bias exhibited stable performance within about 3% of their long-term outdoor exposed performance. This carrier-injection method provides a way to reduce uncertainty arising from fast transients in thin-film module performance between the time a module is removed from light exposure and when it is measured indoors, effectively simulating continuous light exposure by injecting minority carriers that behave much as photocarriers do. This investigation also provides insight into the initial light-induced transients of thin-film modules upon outdoor deployment.

Paper Details

Date Published: 16 October 2012
PDF: 12 pages
Proc. SPIE 8472, Reliability of Photovoltaic Cells, Modules, Components, and Systems V, 84720G (16 October 2012); doi: 10.1117/12.929899
Show Author Affiliations
Chris Deline, National Renewable Energy Lab. (United States)
Adam Stokes, National Renewable Energy Lab. (United States)
Timothy J. Silverman, National Renewable Energy Lab. (United States)
Steve Rummel, National Renewable Energy Lab. (United States)
Dirk Jordan, National Renewable Energy Lab. (United States)
Sarah Kurtz, National Renewable Energy Lab. (United States)


Published in SPIE Proceedings Vol. 8472:
Reliability of Photovoltaic Cells, Modules, Components, and Systems V
Neelkanth G. Dhere; John H. Wohlgemuth, Editor(s)

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