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Proceedings Paper

Time-of-flight photoemission spectroscopy from rare gases for non-invasive, pulse-to-pulse x-ray photon diagnostics at the European XFEL
Author(s): J. Buck; J. Viefhaus; F. Scholz; M. Ilchen; L. Glaser; C. Özkan; W. Freund; J. Grünert; S. Molodtsov
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Paper Abstract

The European X-ray Free Electron Laser (XFEL.EU) under construction will provide highly brilliant soft to hard X-ray (<280 eV - <20 keV) radiation with an intra-bunch train repetition rate of 4.5 MHz by employing the self-amplified spontaneous emission process. The resulting statistical fluctuations of important beam characteristics makes pulse-to-pulse diagnostics data of the photon beam a mandatory reference during user experiments. We present our concepts of analysing the photoemission from rare gases with a time-of-flight spectrometer for non-invasive, pulse-to-pulse measurements of the photon spectrum and polarization with a special emphasis on real-time processing with a low latency of ≤ 10−5 s.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040U (15 October 2012); doi: 10.1117/12.929805
Show Author Affiliations
J. Buck, European XFEL GmbH (Germany)
J. Viefhaus, Deutsches Elektronen-Synchrotron (Germany)
F. Scholz, Deutsches Elektronen-Synchrotron (Germany)
M. Ilchen, European XFEL GmbH (Germany)
Deutsches Elektronen-Synchrotron (Germany)
L. Glaser, Deutsches Elektronen-Synchrotron (Germany)
C. Özkan, European XFEL GmbH (Germany)
W. Freund, European XFEL GmbH (Germany)
J. Grünert, European XFEL GmbH (Germany)
S. Molodtsov, European XFEL GmbH (Germany)


Published in SPIE Proceedings Vol. 8504:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Stefan P. Moeller; Makina Yabashi; Stefan P. Hau-Riege, Editor(s)

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