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Proceedings Paper

The photon beam transport and diagnostics system at FERMI@Elettra, the Italian seeded FEL source: commissioning experience and most recent results
Author(s): Marco Zangrando; Alessandro Abrami; Daniele Cocco; Claudio Fava; Simone Gerusina; Riccardo Gobessi; Nicola Mahne; Eric Mazzucco; Lorenzo Raimondi; Luca Rumiz; Cristian Svetina; Fulvio Parmigiani
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Paper Abstract

FERMI@Elettra, the Italian Free Electron Laser (FEL) source, is in an advanced commissioning phase, having already delivered radiation down to the endstations. The facility is routinely using the low energy branch (FEL1) to produce photons in the 65–20 nm range, while the 20–4 nm range will be covered by FEL2 that is now being commissioned. A dedicated system to collect, diagnose, transport and focus the radiation (PADReS) is used to provide informations about the photon beam intensity, position, spectral content, transverse coherence, and so on. The experience gathered so far, as well as the most recent results both from the diagnostic section and the beam manipulation part are presented here.

Paper Details

Date Published: 15 October 2012
PDF: 8 pages
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 850404 (15 October 2012); doi: 10.1117/12.929749
Show Author Affiliations
Marco Zangrando, Lab. Nazionale TASC (Italy)
Sincrotrone Trieste S.C.p.A. (Italy)
Alessandro Abrami, Sincrotrone Trieste S.C.p.A. (Italy)
Daniele Cocco, SLAC National Accelerator Lab. (United States)
Claudio Fava, Sincrotrone Trieste S.C.p.A. (Italy)
Simone Gerusina, Sincrotrone Trieste S.C.p.A. (Italy)
Riccardo Gobessi, Sincrotrone Trieste S.C.p.A. (Italy)
Nicola Mahne, Sincrotrone Trieste S.C.p.A. (Italy)
Eric Mazzucco, Sincrotrone Trieste S.C.p.A. (Italy)
Lorenzo Raimondi, Sincrotrone Trieste S.C.p.A. (Italy)
Luca Rumiz, Sincrotrone Trieste S.C.p.A. (Italy)
Cristian Svetina, Sincrotrone Trieste S.C.p.A. (Italy)
Fulvio Parmigiani, Sincrotrone Trieste S.C.p.A. (Italy)


Published in SPIE Proceedings Vol. 8504:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Stefan P. Moeller; Makina Yabashi; Stefan P. Hau-Riege, Editor(s)

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