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Proceedings Paper

Spectrally resolved complex transmittance measurements of infrared nanostructured devices
Author(s): Julien Jaeck; Adrien Fallou; Grégory Vincent; Jérôme Primot; Jean-Luc Pelouard; Riad Haïdar
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Paper Abstract

Optical sub-wavelength structures allow to code space-varying complex transmittance functions that induce both amplitude and phase variations on a given wavefront at the micrometer scale. This paves the way to the miniaturization of optical devices based on the spatial coding of the complex transmittance. We describe here a dedicated setup in the infrared range (3-14,um) for the spatial and spectral characterization of such components. The setup combines (i) a quadri-wave lateral shearing interferometer, which enables a two dimensional measurement of phase and amplitude, and (ii) a Fourier Transform Infrared Interferometer for spectral resolution. We present both theoretical simulations and experimental results of the characterization of subwavelength gratings.

Paper Details

Date Published: 13 September 2012
PDF: 8 pages
Proc. SPIE 8493, Interferometry XVI: Techniques and Analysis, 849304 (13 September 2012); doi: 10.1117/12.929742
Show Author Affiliations
Julien Jaeck, ONERA (France)
Adrien Fallou, ONERA (France)
Grégory Vincent, ONERA (France)
Jérôme Primot, ONERA (France)
Jean-Luc Pelouard, LPN, Ctr. National de la Recherche Scientifique (France)
Riad Haïdar, ONERA (France)

Published in SPIE Proceedings Vol. 8493:
Interferometry XVI: Techniques and Analysis
Joanna Schmit; Katherine Creath; Catherine E. Towers; Jan Burke, Editor(s)

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