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Proceedings Paper

Excitation of surface plasmons in Al-coated SNOM tips
Author(s): Viktor Palm; Mihkel Rähn; Joonas Jäme; Vladimir Hizhnyakov
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Paper Abstract

The mesoscopic effect of spectral modulation occurring due to the interference of two photonic fiber modes filtered out by a metal-coated SNOM tip is used to observe the surface plasmon polariton (SPP) excitation in SNOM tips. In a spectrum of the broadband light transmitted by a SNOM tip a region of highly regular spectral modulation can be found, indicating the spectral interval in which only two photonic modes (apparently HE11 and TM01) are transmitted with significant and comparable amplitudes. The modulation period yields the value of optical path difference (OPD) for this pair of modes. Due to the multimode fiber’s inherent modal dispersion, this OPD value depends linearly on the fiber tail length l. An additional contribution to OPD can be generated in a metal-coated SNOM tip due to a mode-dependent photon-plasmon coupling strength resulting in generation of SPPs with different propagation velocities. For an Al-coated 200 nm SNOM tip spectra of transmitted light have been registered for ten different l values. An extrapolation of the linear OPD (l) dependence to l=0 yields a significant residual OPD value, indicating according to our theoretical considerations a mode-selective SPP excitation in the metal-coated tip. The modal dispersion is shown to switch its sign in the SNOM tip. First results of analogous experiments with an Al-coated 150 nm SNOM tip confirm our conclusions.

Paper Details

Date Published: 9 October 2012
PDF: 10 pages
Proc. SPIE 8457, Plasmonics: Metallic Nanostructures and Their Optical Properties X, 84572S (9 October 2012); doi: 10.1117/12.929719
Show Author Affiliations
Viktor Palm, Univ. of Tartu (Estonia)
Mihkel Rähn, Univ. of Tartu (Estonia)
Joonas Jäme, Univ. of Tartu (Estonia)
Vladimir Hizhnyakov, Univ. of Tartu (Estonia)


Published in SPIE Proceedings Vol. 8457:
Plasmonics: Metallic Nanostructures and Their Optical Properties X
Mark I. Stockman, Editor(s)

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