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Proceedings Paper

Development of fast and high throughput tomography using CMOS image detector at SPring-8
Author(s): Kentaro Uesugi; Masato Hoshino; Akihisa Takeuchi; Yoshio Suzuki; Naoto Yagi
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Paper Abstract

A fast micro-tomography system and a high throughput micro-tomography system using state-of-the-art Complementary Metal Oxide Semiconductor (CMOS) imaging devices have been developed at SPring-8. Those systems adopt simple projection type tomography using synchrotron radiation X-ray. The fast micro-tomography system achieves a scan time around 2 s with 1000 projections, which is 15 times faster than previously developed system at SPring-8. The CMOS camera for fast tomography has 64 Giga Byte on-board memory, therefore, the obtained images must be transferred to a PC at the appropriate timing. A melting process of snow at room temperature was imaged every 30 s as a demonstration of the system. The high throughput tomography system adopts a scientific CMOS (sCMOS) camera with a low noise and high quantum efficiency. The system achieves a scan time around 5 minutes which is three times faster than before. The images quality of the system has been compared to the existing system with Charge-Coupled Device (CCD) camera. The results have shown the advantage of the new sCMOS camera.

Paper Details

Date Published: 17 October 2012
PDF: 9 pages
Proc. SPIE 8506, Developments in X-Ray Tomography VIII, 85060I (17 October 2012); doi: 10.1117/12.929575
Show Author Affiliations
Kentaro Uesugi, Japan Synchrotron Radiation Research Institute (Japan)
Masato Hoshino, Japan Synchrotron Radiation Research Institute (Japan)
Akihisa Takeuchi, Japan Synchrotron Radiation Research Institute (Japan)
Yoshio Suzuki, Japan Synchrotron Radiation Research Institute (Japan)
Naoto Yagi, Japan Synchrotron Radiation Research Institute (Japan)


Published in SPIE Proceedings Vol. 8506:
Developments in X-Ray Tomography VIII
Stuart R. Stock, Editor(s)

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