Share Email Print
cover

Proceedings Paper

Single event upset injection simulation and fault-tolerant design for image compression applications
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This paper describes a SEU fault injection framework. Based on the assumption of SEU effects and SEU distribution, the quantitative analysis between measured data and simulation model is investigated. By adjusting some parameters in the simulation-based framework, the proposed framework can be very possibly close to the published data and some accelerated radiation experiments. Furthermore, how the JPEG2000 based hardware architecture is sensitive to SEUs can be found out. In terms of hardware resources and operating frequencies, some fault-tolerant techniques can be introduced to the more sensitive parts, which show the framework's effectiveness in fault-tolerant design for image compression applications.

Paper Details

Date Published: 19 October 2012
PDF: 10 pages
Proc. SPIE 8514, Satellite Data Compression, Communications, and Processing VIII, 851403 (19 October 2012); doi: 10.1117/12.929470
Show Author Affiliations
Jie Guo, Xidian Univ. (China)
Yunsong Li, Xidian Univ. (China)
Kai Liu, Xidian Univ. (China)
Jie Lei, Xidian Univ. (China)
Chengke Wu, Xidian Univ. (China)


Published in SPIE Proceedings Vol. 8514:
Satellite Data Compression, Communications, and Processing VIII
Bormin Huang; Antonio J. Plaza; Carole Thiebaut, Editor(s)

© SPIE. Terms of Use
Back to Top