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Proceedings Paper

Photo-reduction of silver ion by two-photon excitation using femtosecond laser
Author(s): Ryotaro Nakamura; Kenji Kinashi; Wataru Sakai; Naoto Tsutsumi
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Paper Abstract

Two-photon excitation for creating 3D structure has widely been studied because this technique can be applied for various fields, for example creating of optoelectronic device and micro-optics. This technique was first used for photoresist. However it was used as method to create metal structure which has functionality like enhancement of electromagnetic field. We have already reported the 3D microstructures with submicron scale linewidth fabricated through two-photon photo-reduction of silver ions in poly(N-vinylpyrrolidone) (PVP) matrix using a femtosecond laser system. We studied the morphological behavior of two-dimensional silver structures fabricated by two-photon excitation of silver nitrate in PVP matrix to further analyze. The silver structure near the cover slip was fabricated on a microscope stage. Obtained structure was investigated using an atomic force microscopy (AFM), a scanning electron microscopy (SEM), an energy dispersive X-ray spectrometry (EDX), and an X-ray photoelectron spectroscopy (XPS). AFM measurement showed the photo-induced structure on a cover slip. EDX and XPS measurements showed that the silver ion was photo-reduced and the photo-reduced silver was interacted with PVP, respectively. We assume that the silver makes a cluster and the cluster is covered by PVP chain.

Paper Details

Date Published: 11 October 2012
PDF: 6 pages
Proc. SPIE 8474, Optical Processes in Organic Materials and Nanostructures, 847416 (11 October 2012); doi: 10.1117/12.929370
Show Author Affiliations
Ryotaro Nakamura, Kyoto Institute of Technology (Japan)
Kenji Kinashi, Kyoto Institute of Technology (Japan)
Wataru Sakai, Kyoto Institute of Technology (Japan)
Naoto Tsutsumi, Kyoto Institute of Technology (Japan)

Published in SPIE Proceedings Vol. 8474:
Optical Processes in Organic Materials and Nanostructures
Rachel Jakubiak; Manfred Eich; Jean-Michel Nunzi, Editor(s)

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