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Proceedings Paper

Registration of high-intensity electron and x-ray fields with polycrystalline CVD diamond detectors
Author(s): L. N. Davydov; A. V. Rybka; A. A. Vierovkin; S. F. Dudnik; V. I. Gritsyna; V. E. Kutny; O. A. Opalev; V. A. Shevchenko; I. N. Shlyahov; V. E. Strelnitsky; A. Eh. Tenishev; V. L. Uvarov; R. B. James; A. E. Bolotnikov; P. M. Fochuk
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Paper Abstract

We developed radiation-hard diamond detectors for registering intense fields of high energy electrons and X-rays, and monitoring the mode of operation of electron accelerators. After synthesizing a diamond film of detection quality up to 350-microns thick by chemical vapor deposition (CVD), we analyzed it by infra-red spectroscopy. We also developed techniques for heat treatment of the film, chemical etching, substrate removal, contact application, and priming by an exposure to X-rays and electrons. This work supported the production of detectors with a specific resistance of 1014Ohm×cm. The dependence of the detector signal’s amplitude on the displacement voltage was investigated under exposure to a direct electron beam with a current ranging from 660 to 930 mA. The duration of the leading edge of a detector pulse was 5 μs. Experiments also were undertaken on the registration by diamond detectors of Bremsstrahlung radiation with an end-point energy of 9 to 70 MeV. We also evaluated the dependence of the amplitude of the detector’s signal on the displacement voltage. Our comparison of detectors’ physical properties and detectors’ response to alphaparticle irradiation before and after the exposure to the accelerator beam showed no degradation, even after the absorbed dose exceeded 11.5 MGy.

Paper Details

Date Published: 24 October 2012
PDF: 12 pages
Proc. SPIE 8507, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV, 85071N (24 October 2012); doi: 10.1117/12.929291
Show Author Affiliations
L. N. Davydov, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
A. V. Rybka, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
A. A. Vierovkin, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
S. F. Dudnik, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
V. I. Gritsyna, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
V. E. Kutny, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
O. A. Opalev, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
V. A. Shevchenko, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
I. N. Shlyahov, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
V. E. Strelnitsky, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
A. Eh. Tenishev, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
V. L. Uvarov, National Science Ctr. Kharkov Institute of Physics and Technology (Ukraine)
R. B. James, Brookhaven National Lab. (United States)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
P. M. Fochuk, Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 8507:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV
Ralph B. James; Arnold Burger; Larry A. Franks; Michael Fiederle, Editor(s)

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