Share Email Print
cover

Proceedings Paper

Interdependency of mechanical failure rate of encapsulated solar cells and module design parameters
Author(s): Sascha Dietrich; Martin Sander; Matthias Pander; Matthias Ebert
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In recent studies the mechanical reliability of encapsulated solar cells was numerically investigated. A finite element model of a solar module with all essential components, such as cells, polymer layers and frame was created. The principle stress field in each solar cell was calculated by exposing the module to distributed pressure loads on the glass surface. By means of a probabilistic approach based on the Weibull distribution function and the size effect the stress field was evaluated and the probability of failure of each solar cell was calculated. This approach is new in the reliability evaluation of encapsulated solar cells and can enhance the module design process. Two fundamental studies were carried out varying the mounting and frame as well as the encapsulant and its thickness. The results show that there is an interdependency between the stiffness of the frame section and the type of mounting. Furthermore the recommendation for an appropriate frame and mounting selection can change if the magnitude of the load changes. It was found that there is a correlation between the stiffness of the encapsulant and the fundamental mechanical behavior of the module laminate. For high stiffness values a sandwich behavior is dominant whereas for small stiffness values a laminate behavior with shear deformation is dominant. This results in contrary thickness recommendations for different encapsulants as well as temperatures. For high stiffness values respectively low temperatures a thin encapsulant is advantageous whereas for low stiffness values at high temperatures a thick encapsulant would be better.

Paper Details

Date Published: 16 October 2012
PDF: 9 pages
Proc. SPIE 8472, Reliability of Photovoltaic Cells, Modules, Components, and Systems V, 84720P (16 October 2012); doi: 10.1117/12.929289
Show Author Affiliations
Sascha Dietrich, Fraunhofer-Ctr. für Silizium-Photovoltaik (Germany)
Martin Sander, Fraunhofer-Ctr. für Silizium-Photovoltaik (Germany)
Matthias Pander, Fraunhofer-Ctr. für Silizium-Photovoltaik (Germany)
Matthias Ebert, Fraunhofer-Ctr. für Silizium-Photovoltaik (Germany)


Published in SPIE Proceedings Vol. 8472:
Reliability of Photovoltaic Cells, Modules, Components, and Systems V
Neelkanth G. Dhere; John H. Wohlgemuth, Editor(s)

© SPIE. Terms of Use
Back to Top