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Proceedings Paper

Rapid spatial characterization measurements of a multi-element focal plane using derived geometrical information
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Paper Abstract

While some instrument requirements are levied on a per-pixel basis, efficiencies and economies can be gained by testing them in parallel. Furthermore, the use of detector arrays as imagers with extended targets enables the derivation of geometrical information from select pixels in each image, and its propagation to neighboring pixels. We discuss the implementation of one such test regime for the Operational Landsat Imager (OLI) at Ball Aerospace and Technologies Corp. This enabled rapid measurement of spatial parameters, including Edge Response Function and aliasing, for all of the nearly 70,000 active pixels of the focal plane assembly with reduced reliance on the precision and stability of the supporting equipment. The derived geometrical information enabled us to replace a step-stare testing of individual pixels with a continuous scan of the entire assembly, without demanding precision motion or introducing noise from variations in the scan velocity. Three complete scans were performed in under 30 hours.

Paper Details

Date Published: 15 October 2012
PDF: 11 pages
Proc. SPIE 8491, Optical System Alignment, Tolerancing, and Verification VI, 84910C (15 October 2012); doi: 10.1117/12.929117
Show Author Affiliations
James W. Baer, Ball Aerospace & Technologies Corp. (United States)
Thomas F. Drouillard, Ball Aerospace & Technologies Corp. (United States)


Published in SPIE Proceedings Vol. 8491:
Optical System Alignment, Tolerancing, and Verification VI
José Sasián; Richard N. Youngworth, Editor(s)

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