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Proceedings Paper

Spectral encoding based measurement of x-ray/optical relative delay to ~10 fs rms
Author(s): Mina R. Bionta; Doug French; James P. Cryan; James M. Glownia; Nick Hartmann; David J. Nicholson; Kevin Baker; Christoph Bostedt; Marco Cammarrata; Matthieu Chollet; Yuantao Ding; David M. Fritz; Steve M. Durbin; Yiping Feng; Marion Harmand; Alan R. Fry; Daniel J. Kane; Jacek Krzywinski; Henrik T. Lemke; Marc Messerschmidt; Daniel F. Ratner; Sebastian Schorb; Sven Toleikis; Diling Zhu; William E. White; Ryan N. Coffee
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Paper Abstract

A recently demonstrated single-shot measurement of the relative delay between x-ray FEL pulses and optical laser pulses has now been improved to ~10 fs rms error and has successfully been demonstrated for both soft and hard x-ray pulses. It is based on x-ray induced step-like reduction in optical transmissivity of a semiconductor membrane (Si3N4). The transmissivity is probed by an optical continuum spanning 450 - 650 nm where spectral chirp provides a mapping of the step in spectrum to the arrival time of the x-ray pulse relative to the optical laser system.

Paper Details

Date Published: 15 October 2012
PDF: 7 pages
Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040M (15 October 2012); doi: 10.1117/12.929097
Show Author Affiliations
Mina R. Bionta, SLAC National Accelerator Lab. (United States)
Doug French, SLAC National Accelerator Lab. (United States)
James P. Cryan, Lawrence Berkeley National Lab (United States)
James M. Glownia, SLAC National Accelerator Lab. (United States)
Stanford Univ. (United States)
Nick Hartmann, SLAC National Accelerator Lab. (United States)
David J. Nicholson, SLAC National Accelerator Lab. (United States)
Stanford Univ. (United States)
Kevin Baker, Lawrence Livermore National Lab (United States)
Christoph Bostedt, SLAC National Accelerator Lab. (United States)
Marco Cammarrata, Univ. de Rennes (France)
Matthieu Chollet, SLAC National Accelerator Lab. (United States)
Yuantao Ding, SLAC National Accelerator Lab. (United States)
David M. Fritz, SLAC National Accelerator Lab. (United States)
Steve M. Durbin, Univ de Rennes (United States)
Yiping Feng, SLAC National Accelerator Lab. (United States)
Marion Harmand, Deutsches Elektronen-Synchrotron (Germany)
Alan R. Fry, SLAC National Accelerator Lab. (United States)
Daniel J. Kane, Mesa Photonics, LLC (United States)
Jacek Krzywinski, SLAC National Accelerator Lab. (United States)
Henrik T. Lemke, SLAC National Accelerator Lab. (United States)
Marc Messerschmidt, SLAC National Accelerator Lab. (United States)
Daniel F. Ratner, SLAC National Accelerator Lab. (United States)
Sebastian Schorb, SLAC National Accelerator Lab. (United States)
Sven Toleikis, Deutsches Elektronen-Synchrotron (Germany)
Diling Zhu, SLAC National Accelerator Lab. (United States)
William E. White, SLAC National Accelerator Lab. (United States)
Ryan N. Coffee, SLAC National Accelerator Lab. (United States)


Published in SPIE Proceedings Vol. 8504:
X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications
Stefan P. Moeller; Makina Yabashi; Stefan P. Hau-Riege, Editor(s)

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