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Some structural and optical properties of thin and thick CdTe and CdxMn1-xTe films
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Paper Abstract

In work the complex investigation of structural and optical properties of CdTe and Cd1-xMnxTe semiconductor films deposited by close-spaced vacuum sublimation method using thermal evaporation on non-oriented substrates was carried out. The structural and phase analysis of the layers condensed at different substrate temperatures was performed.

Paper Details

Date Published: 24 October 2012
PDF: 7 pages
Proc. SPIE 8507, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV, 85071K (24 October 2012); doi: 10.1117/12.929017
Show Author Affiliations
A. S. Opanasyuk, Sumy State Univ. (Ukraine)
P. V. Koval, Sumy State Univ. (Ukraine)
V. V. Kosyak, The Univ. of Utah (United States)
P. M. Fochuk, Chernivtsi National Univ. (Ukraine)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
R. B. James, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 8507:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XIV
Ralph B. James; Arnold Burger; Larry A. Franks; Michael Fiederle, Editor(s)

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