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Proceedings Paper

Holographic imaging and interferometry with non-Bragg diffraction orders in lithium niobate and photothermoplastic materials
Author(s): Nickolai Kukhtarev; Tatiana Kukhtareva; Arcadi Chirita
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Paper Abstract

We investigated recording of holographic volume and surface-relief gratings in photorefractive crystal and in a photo-thermoplastic (PTP) holographic camera. Holographic recording with an image-bearing signal beam leads to the appearance of two Bragg and two or more non-Bragg diffracted beams that shows the transformed images in each beam (rotation and angular amplification of images). Using this real-time mode of interferometry, the hologram is retrieved with a deformed object beam, resulting in the appearance of fringes with a proper phase shift in each of four diffracted beams. Retrieval with a time-modulated single-pixel object beam lead of time-modulated response in all diffraction orders. This one-shot (one-exposure) phase-shifting interferometry results in clarifying the object wave-front information (as an example, from the surface deformation) and solving the sign ambiguity problem. This procedure demonstrates that high-resolution holographic imaging of the PTP holographic camera static deformations in the order of ~0.1mm can be revealed on the diffusion reflection surface. In addition, it was demonstrated, that using the PTP materials could achieve holographic recording and imaging through phase aberration, with the image appearing in the non-Bragg diffraction order.

Paper Details

Date Published: 15 October 2012
PDF: 10 pages
Proc. SPIE 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI, 849706 (15 October 2012); doi: 10.1117/12.928543
Show Author Affiliations
Nickolai Kukhtarev, Alabama A&M Univ. (United States)
Tatiana Kukhtareva, Alabama A&M Univ. (United States)
Arcadi Chirita, State Univ. of Moldova (Moldova)


Published in SPIE Proceedings Vol. 8497:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI
Shizhuo Yin; Ruyan Guo, Editor(s)

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