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Proceedings Paper

Development and optimization of THz NDT on aeronautics composite multilayered structures
Author(s): M. Vandewal; J. Depauw; K. Rombaut; R. Beigang; J. Jonuscheit; P. Mounaix; I. Sáez de Ocáriz; R. Martínez Edo; A. Priegue; Y. Sternberg
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Paper Abstract

The availability of light and robust structures has led to an increased use of composite materials in the aircraft industry. In order to verify and guarantee the high quality of the conventional and new composite elements, innovative approaches for non-destructive testing of these parts are required. The European research project "DOTNAC" proposes to develop a fast, high resolution, non-invasive and non-contact inspection system for assessing aeronautic composite parts during production using terahertz waves. Conventionally two categories of systems can be discussed: pulsed and continuous wave terahertz systems. Both will be realized and their respective potential as a non-destructive inspection tool will be evaluated against the performance of X-ray testing, ultrasound non-destructive testing, and infra-red imaging.

Paper Details

Date Published: 9 May 2012
PDF: 9 pages
Proc. SPIE 8363, Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense, 83630Y (9 May 2012); doi: 10.1117/12.928287
Show Author Affiliations
M. Vandewal, Royal Belgian Military Academy (Belgium)
J. Depauw, Innov Support (Belgium)
K. Rombaut, Verhaert (Belgium)
R. Beigang, Fraunhofer-Institut für Physikalische Messtechnik (Germany)
J. Jonuscheit, Technische Univ. Kaiserslautern (Germany)
P. Mounaix, Lab. Ondes et Matière d'Aquitaine, CNRS, Univ. Bordeaux (France)
I. Sáez de Ocáriz, Ctr. de Tecnologías Aeronáuticas (Spain)
R. Martínez Edo, Univ. Autònoma de Barcelona (Spain)
A. Priegue, Univ. Politècnica de Catalunya (Spain)
Y. Sternberg, Israel Aerospace Industries (Israel)


Published in SPIE Proceedings Vol. 8363:
Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense
A. F. Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)

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