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Proceedings Paper

Low voltage, high speed electro-optic scanner and switch in thin film lithium niobate
Author(s): James E. Toney; Michael Shnider; Neil Smith; Peter Pontius; James Busch; Vincent E. Stenger; Andrea Pollick; Sri Sriram
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Paper Abstract

The prism-based electro-optic beam deflector is a well-known technology dating back several decades. The primary factor that has inhibited its wide-spread application is the need for high control voltages - typically around 1,000V per degree of scanning for a device fabricated in bulk lithium niobate. We have used crystal ion slicing of lithium niobate to realize a beam deflector with an order-of-magnitude higher deflection sensitivity. We have demonstrated 1x5 switching of near-infrared light with a voltage swing of only +/-75V. While the optimal design of bulk deflectors is well established, the thin-film geometry requires careful consideration of the crucial factors of light coupling efficiency and control of beam divergence. This paper will discuss design issues for integrated 1xN switches based on this technology and their application to implementing a practical true time delay module for phased array systems.

Paper Details

Date Published: 24 October 2012
PDF: 11 pages
Proc. SPIE 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI, 849709 (24 October 2012); doi: 10.1117/12.927472
Show Author Affiliations
James E. Toney, SRICO Inc. (United States)
Michael Shnider, SRICO Inc. (United States)
Neil Smith, SRICO Inc. (United States)
Peter Pontius, SRICO Inc. (United States)
James Busch, SRICO Inc. (United States)
Vincent E. Stenger, SRICO Inc. (United States)
Andrea Pollick, SRICO Inc. (United States)
Sri Sriram, SRICO Inc. (United States)

Published in SPIE Proceedings Vol. 8497:
Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI
Shizhuo Yin; Ruyan Guo, Editor(s)

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