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Proceedings Paper

UV photon-counting CCD detectors that enable the next generation of UV spectroscopy missions: AR coatings that can achieve 80-90% QE
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Paper Abstract

We describe recent progress in the development of anti-reflection coatings for use at UV wavelengths on CCDs and other Si-based detectors. We have previously demonstrated a set of coatings which are able to achieve greater than 50% QE in 4 bands from 130nm to greater than 300nm. We now present new refinements of these AR-coatings which will improve performance in a narrower bandpass by 50% over previous work. Successful test films have been made to optimize transmission at 190nm, reaching 80% potential transmission.

Paper Details

Date Published: 25 September 2012
PDF: 7 pages
Proc. SPIE 8453, High Energy, Optical, and Infrared Detectors for Astronomy V, 845309 (25 September 2012); doi: 10.1117/12.927208
Show Author Affiliations
Erika T. Hamden, Columbia Univ. (United States)
Frank Greer, Jet Propulsion Lab. (United States)
David Schiminovich, Columbia Univ. (United States)
Shouleh Nikzad, Jet Propulsion Lab. (United States)
D. Christopher Martin, California Institute of Technology (United States)


Published in SPIE Proceedings Vol. 8453:
High Energy, Optical, and Infrared Detectors for Astronomy V
Andrew D. Holland; James W. Beletic, Editor(s)

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