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Proceedings Paper

VLT deformable secondary mirror: integration and electromechanical tests results
Author(s): R. Biasi; M. Andrighettoni; G. Angerer; C. Mair; D. Pescoller; P. Lazzarini; E. Anaclerio; M. Mantegazza; D. Gallieni; E. Vernet; R. Arsenault; P.-Y. Madec; P. Duhoux; A. Riccardi; M. Xompero; R. Briguglio; M. Manetti; M. Morandini
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Paper Abstract

The VLT Deformable secondary is planned to be installed on the VLT UT#4 as part of the telescope conversion into the Adaptive Optics test Facility (AOF). The adaptive unit is based on the well proven contactless, voice coil motor technology that has been already successfully implemented in the MMT, LBT and Magellan adaptive secondaries, and is considered a promising technical choice for the forthcoming ELT-generation adaptive correctors, like the E-ELT M4 and the GMT ASM. The VLT adaptive unit has been recently assembled after the completion of the manufacturing and modular test phases. In this paper, we present the most relevant aspects of the system integration and report the preliminary results of the electromechanical tests performed on the unit. This test campaign is a typical major step foreseen in all similar systems built so far: thanks to the metrology embedded in the system, that allows generating time-dependent stimuli and recording in real time the position of the controlled mirror on all actuators, typical dynamic response quality parameters like modal settling time, overshoot and following error can be acquired without employing optical measurements. In this way the system dynamic and some aspect of its thermal and long term stability can be fully characterized before starting the optical tests and calibrations.

Paper Details

Date Published: 13 September 2012
PDF: 10 pages
Proc. SPIE 8447, Adaptive Optics Systems III, 84472G (13 September 2012); doi: 10.1117/12.927087
Show Author Affiliations
R. Biasi, Microgate S.r.l. (Italy)
M. Andrighettoni, Microgate S.r.l. (Italy)
G. Angerer, Microgate S.r.l. (Italy)
C. Mair, Microgate S.r.l. (Italy)
D. Pescoller, Microgate S.r.l. (Italy)
P. Lazzarini, A.D.S. International S.r.l. (Italy)
E. Anaclerio, A.D.S. International S.r.l. (Italy)
M. Mantegazza, A.D.S. International S.r.l. (Italy)
D. Gallieni, A.D.S. International S.r.l. (Italy)
E. Vernet, European Southern Observatory (Germany)
R. Arsenault, European Southern Observatory (Germany)
P.-Y. Madec, European Southern Observatory (Germany)
P. Duhoux, European Southern Observatory (Germany)
A. Riccardi, INAF - Osservatorio Astrofisico di Arcetri (Italy)
M. Xompero, INAF - Osservatorio Astrofisico di Arcetri (Italy)
R. Briguglio, INAF - Osservatorio Astrofisico di Arcetri (Italy)
M. Manetti, Politecnico di Milano (Italy)
M. Morandini, Politecnico di Milano (Italy)


Published in SPIE Proceedings Vol. 8447:
Adaptive Optics Systems III
Brent L. Ellerbroek; Enrico Marchetti; Jean-Pierre Véran, Editor(s)

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