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Proceedings Paper

An integrated 1-5 micron test bench for the characterization of cryogenic optical elements
Author(s): Udo J. Wehmeier; Jarron Leisenring; Olivier Durney; Elliott Solheid; Gerard A. Luppino; Michael R. Meyer
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Paper Abstract

We report on the final design and current status of a 1-5 micron infrared test bench at the ETH Zurich Institute for Astronomy. This facility will enable us to characterize infrared optics, both reflective and transmissive, at cryogenic operating temperatures for both ground- and space-based applications. A focus of our lab is to facilitate the detection and characterization of extra-solar planets. The test bench is designed to characterize a range of spectrally dispersive and diffraction suppression optics such as filters, grisms, gratings, as well as both focal and pupil plane coronagraphs. The test bench is built around a 2048x2048 HAWAII-2RG detector from Teledyne Imaging Systems. The optical bench is envisioned to operate down to 30 K. “First light” is expected in the second half of 2012. We outline the status of the project, and describe the capabilities of the test bench in detail in order to alert potential collaborators to this new capability.

Paper Details

Date Published: 24 September 2012
PDF: 16 pages
Proc. SPIE 8446, Ground-based and Airborne Instrumentation for Astronomy IV, 84463G (24 September 2012); doi: 10.1117/12.927066
Show Author Affiliations
Udo J. Wehmeier, Institute for Astronomy, ETH Zürich (Switzerland)
Jarron Leisenring, Institute for Astronomy, ETH Zürich (Switzerland)
Olivier Durney, Orion Labs, LLC (United States)
Elliott Solheid, Orion Labs, LLC (United States)
Gerard A. Luppino, GL Scientific, Inc. (United States)
Michael R. Meyer, Institute for Astronomy, ETH Zürich (Switzerland)


Published in SPIE Proceedings Vol. 8446:
Ground-based and Airborne Instrumentation for Astronomy IV
Ian S. McLean; Suzanne K. Ramsay; Hideki Takami, Editor(s)

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