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Proceedings Paper

Design and characterization of 90 GHz feedhorn-coupled TES polarimeter pixels in the SPTpol camera
Author(s): J. T. Sayre; P. Ade; K. A. Aird; J. E. Austermann; J. A. Beall; D. Becker; B. A. Benson; L. E. Bleem; J. Britton; J. E. Carlstrom; C. L. Chang; H.-M. Cho; T. M. Crawford; A. T. Crites; A. Datesman; T. de Haan; M. A. Dobbs; W. Everett; A. Ewall-Wice; E. M. George; N. W. Halverson; N. Harrington; J. W. Henning; G. C. Hilton; W. L. Holzapfel; J. Hubmayr; K. D. Irwin; M. Karfunkle; R. Keisler; J. Kennedy; A. T. Lee; E. Leitch; D. Li; M. Lueker; D. P. Marrone; J. J. McMahon; J. Mehl; S. S. Meyer; J. Montgomery; T. E. Montroy; J. Nagy; T. Natoli; J. P. Nibarger; M. D. Niemack; V. Novosad; S. Padin; C. Pryke; C. L. Reichardt; J. E. Ruhl; B. R. Saliwanchik; K. K. Schaffer; E. Shirokoff; K. Story; C. Tucker; K. Vanderlinde; J. D. Vieira; G. Wang; R. Williamson; V. Yefremenko; K. W. Yoon; E. Young
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Paper Abstract

The SPTpol camera is a two-color, polarization-sensitive bolometer receiver, and was installed on the 10 meter South Pole Telescope in January 2012. SPTpol is designed to study the faint polarization signals in the Cosmic Microwave Background, with two primary scientific goals. One is to constrain the tensor-to-scalar ratio of perturbations in the primordial plasma, and thus constrain the space of permissible in inflationary models. The other is to measure the weak lensing effect of large-scale structure on CMB polarization, which can be used to constrain the sum of neutrino masses as well as other growth-related parameters. The SPTpol focal plane consists of seven 84-element monolithic arrays of 150 GHz pixels (588 total) and 180 individual 90 GHz single- pixel modules. In this paper we present the design and characterization of the 90 GHz modules.

Paper Details

Date Published: 5 October 2012
PDF: 12 pages
Proc. SPIE 8452, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI, 845239 (5 October 2012); doi: 10.1117/12.927035
Show Author Affiliations
J. T. Sayre, Case Western Reserve Univ. (United States)
P. Ade, Cardiff Univ. (United Kingdom)
K. A. Aird, The Univ. of Chicago (United States)
J. E. Austermann, Univ. of Colorado at Boulder (United States)
J. A. Beall, National Institute of Standards and Technology (United States)
D. Becker, National Institute of Standards and Technology (United States)
B. A. Benson, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
L. E. Bleem, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
J. Britton, National Institute of Standards and Technology (United States)
J. E. Carlstrom, Case Western Reserve Univ. (United States)
Argonne National Lab. (United States)
The Univ. of Chicago (United States)
C. L. Chang, Case Western Reserve Univ. (United States)
Argonne National Lab. (United States)
The Univ. of Chicago (United States)
H.-M. Cho, National Institute of Standards and Technology (United States)
T. M. Crawford, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
A. T. Crites, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
A. Datesman, Argonne National Lab. (United States)
T. de Haan, McGill Univ. (Canada)
M. A. Dobbs, McGill Univ. (Canada)
W. Everett, The Univ. of Chicago (United States)
A. Ewall-Wice, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
E. M. George, Univ. of California, Berkeley (United States)
N. W. Halverson, Univ. of Colorado at Boulder (United States)
N. Harrington, Univ. of California, Berkeley (United States)
J. W. Henning, Univ. of Colorado at Boulder (United States)
G. C. Hilton, National Institute of Standards and Technology (United States)
W. L. Holzapfel, Univ. of California, Berkeley (United States)
J. Hubmayr, National Institute of Standards and Technology (United States)
K. D. Irwin, National Institute of Standards and Technology (United States)
M. Karfunkle, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
R. Keisler, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
J. Kennedy, McGill Univ. (Canada)
A. T. Lee, Univ. of California, Berkeley (United States)
E. Leitch, The Univ. of Chicago (United States)
D. Li, National Institute of Standards and Technology (United States)
M. Lueker, California Institute of Technology (United States)
D. P. Marrone, Univ. of Arizona (United States)
J. J. McMahon, Univ. of Michigan (United States)
J. Mehl, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
S. S. Meyer, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
J. Montgomery, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
T. E. Montroy, Case Western Reserve Univ. (United States)
J. Nagy, Case Western Reserve Univ. (United States)
T. Natoli, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
J. P. Nibarger, National Institute of Standards and Technology (United States)
M. D. Niemack, National Institute of Standards and Technology (United States)
V. Novosad, Argonne National Lab. (United States)
S. Padin, The Univ. of Chicago (United States)
C. Pryke, Univ. of Minnesota (United States)
C. L. Reichardt, Univ. of California, Berkeley (United States)
J. E. Ruhl, Case Western Reserve Univ. (United States)
B. R. Saliwanchik, Case Western Reserve Univ. (United States)
K. K. Schaffer, The School of the Art Institute of Chicago (United States)
E. Shirokoff, California Institute of Technology (United States)
K. Story, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
C. Tucker, Cardiff Univ. (United Kingdom)
K. Vanderlinde, McGill Univ. (Canada)
J. D. Vieira, California Institute of Technology (United States)
G. Wang, Argonne National Lab. (United States)
R. Williamson, Case Western Reserve Univ. (United States)
The Univ. of Chicago (United States)
V. Yefremenko, Argonne National Lab. (United States)
K. W. Yoon, National Institute of Standards and Technology (United States)
E. Young, Univ. of California, Berkeley (United States)


Published in SPIE Proceedings Vol. 8452:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI
Wayne S. Holland, Editor(s)

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