Share Email Print

Proceedings Paper

Far ultraviolet sensitivity of silicon CMOS sensors
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We describe vacuum ultraviolet sensitivity measurements of a new high performance silicon-based CMOS sensor from Teledyne Imaging Sensors. These sensors do not require the high voltages of MCP detectors, making them a lower mass and power alternative to the more mature MCP technology. These devices demonstrate up to 40 percent quantum efficiency at vacuum ultraviolet wavelengths, either meeting or greatly exceeding 10 percent quantum efficiency across the entire 100-200 nm wavelength region. As with similar visible sensitive devices, backside illumination results in a higher quantum efficiency than frontside illumination. Measurements of the vacuum ultraviolet sensitivity of the Teledyne silicon PIN detectors were made by directing a known intensity of ultraviolet light at discrete wavelengths onto the test detectors and reading out the resulting photocurrent. The sensitivity of the detector at a given wavelength was then calculated from the intensity and wavelength of the incoming light and the relative photodiode to NIST-traceable calibration diode active areas. A custom electromechanical interface was developed to make these measurements within the SwRI Vacuum Radiometric Calibration Chamber. While still in the single pixel stage, full 1K × 1K focal plane arrays are possible using existing CMOS readout electronics and hold great promise for inclusion in future spaceflight instrument concepts.

Paper Details

Date Published: 25 September 2012
PDF: 12 pages
Proc. SPIE 8453, High Energy, Optical, and Infrared Detectors for Astronomy V, 845308 (25 September 2012); doi: 10.1117/12.926677
Show Author Affiliations
Michael W. Davis, Southwest Research Institute (United States)
Thomas K. Greathouse, Southwest Research Institute (United States)
Kurt D. Retherford, Southwest Research Institute (United States)
Gregory S. Winters, Southwest Research Institute (United States)
Yibin Bai, Teledyne Imaging Sensors (United States)
James W. Beletic, Teledyne Imaging Sensors (United States)

Published in SPIE Proceedings Vol. 8453:
High Energy, Optical, and Infrared Detectors for Astronomy V
Andrew D. Holland; James W. Beletic, Editor(s)

© SPIE. Terms of Use
Back to Top