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Proceedings Paper

First measurement of the ASTRO-H soft x-ray telescope performance
Author(s): Takashi Okajima; Peter J. Serlemitsos; Yang Soong; Devin J. Hahne
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Paper Abstract

ASTRO-H is a Japanese X-ray astrophysics satellite under the development led by Japan and US. It will have two Soft X-ray Telescopes (SXTs), among other instruments, that are being developed by NASA's Goddard Space Flight Center. One is for an X-ray micro-calorimeter instrument and the other for an X-ray CCD camera, both covering the X-ray energy band below 15 keV. The SXT Engineering Model (EM) quadrant was successfully completed and has shown big improvements in the X-ray performance from Suzaku owing to number of changes made. The EM was tested at the Goddard 100-m X-ray beamline (diverging beam) and the ISAS/JAXA beamline (pencil beam scan). The angular resolution was found to be 1.1 arcmin at Goddard, while 1.27 arcmin at ISAS, and the effective area was 157 and 122 cm2 at 1 and 6 keV, respectively. The discrepancy in the angular resolution can be explained by the difference of the measurement method, i.e. the diverging beam vs. the pencil beam scan. The development of the first Flight Model (FM) is underway. The first three quadrants are completed so far and show about 1 arcmin (HPD) angular resolution. We expect that the first FM SXT will have about 1 arcmin resolution, which will be completed in September, 2012.

Paper Details

Date Published: 17 September 2012
PDF: 8 pages
Proc. SPIE 8443, Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray, 844320 (17 September 2012); doi: 10.1117/12.926443
Show Author Affiliations
Takashi Okajima, NASA Goddard Space Flight Ctr. (United States)
Peter J. Serlemitsos, NASA Goddard Space Flight Ctr. (United States)
Yang Soong, NASA Goddard Space Flight Ctr. (United States)
Devin J. Hahne, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 8443:
Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray
Tadayuki Takahashi; Stephen S. Murray; Jan-Willem A. den Herder, Editor(s)

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