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Proceedings Paper

Design, testing, and performance of the Hobby Eberly Telescope prime focus instrument package
Author(s): Brian Vattiat; Gary J. Hill; Hanshin Lee; Dave M. Perry; Marc D. Rafal; Tom Rafferty; Richard Savage; Charles A. Taylor III; Walter Moreira; Michael Smith
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Paper Abstract

The Hobby-Eberly Telescope (HET) is undergoing an upgrade to increase the field of view to 22 arc-minutes with the dark energy survey HETDEX the initial science goal [1]. Here we report on the engineering development of a suite of instruments located at prime focus of the upgraded HET. The Prime Focus Instrument Package (PFIP) contains acquisition, guiding, and wave front sensing instrumentation [2], the fiber feeds for the facility spectrographs (VIRUS, HRS, MRS, LRS2), and ancillary hardware. This paper reviews the design and functions of the PFIP and presents details of the mechanical design, integration and testing.

Paper Details

Date Published: 24 September 2012
PDF: 15 pages
Proc. SPIE 8446, Ground-based and Airborne Instrumentation for Astronomy IV, 844672 (24 September 2012); doi: 10.1117/12.926413
Show Author Affiliations
Brian Vattiat, McDonald Observatory, The Univ. of Texas at Austin (United States)
Gary J. Hill, McDonald Observatory, The Univ. of Texas at Austin (United States)
Hanshin Lee, McDonald Observatory, The Univ. of Texas at Austin (United States)
Dave M. Perry, McDonald Observatory, The Univ. of Texas at Austin (United States)
Marc D. Rafal, McDonald Observatory, The Univ. of Texas at Austin (United States)
Tom Rafferty, McDonald Observatory, The Univ. of Texas at Austin (United States)
Richard Savage, McDonald Observatory, The Univ. of Texas at Austin (United States)
Charles A. Taylor III, McDonald Observatory, The Univ. of Texas at Austin (United States)
Walter Moreira, McDonald Observatory, The Univ. of Texas at Austin (United States)
Michael Smith, Univ. of Wisconsin-Madison (United States)


Published in SPIE Proceedings Vol. 8446:
Ground-based and Airborne Instrumentation for Astronomy IV
Ian S. McLean; Suzanne K. Ramsay; Hideki Takami, Editor(s)

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