Share Email Print
cover

Proceedings Paper

Characterization of bent crystals for Laue lenses
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In the context of the LAUE project devoted to build a long focal-length focusing optics for soft γ–ray astronomy (80 – 600 keV), we present the results of reflectivity measurements of bent crystals in different configurations, obtained by bending perfect or mosaic flat crystals. We also compare these results with those obtained using flat crystals. The measurements were performed using the Kα line of the Tungsten anode of the X–ray tube in the LARIX facility at the University of Ferrara. These results are finalized to select the best materials and to optimize the thickness of the crystal tiles that will be used for building a Laue lens petal which is a part of an entire Laue lens, with 20 m focal length and 100–300 keV passband. The final goal of the LAUE project is to overcome, by at least 2 orders of magnitude, the sensitivity limits of the current generation of γ–ray telescopes, and to improve the current γ–ray imaging capability.

Paper Details

Date Published: 25 September 2012
PDF: 10 pages
Proc. SPIE 8443, Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray, 844332 (25 September 2012); doi: 10.1117/12.926364
Show Author Affiliations
V. Liccardo, Univ. degli Studi di Ferrara (Italy)
Univ. de Sophia Antipolis (France)
E. Virgilli, Univ. degli Studi di Ferrara (Italy)
F. Frontera, Univ. degli Studi di Ferrara (Italy)
V. Valsan, Univ. degli Studi di Ferrara (Italy)
Univ. de Sophia Antipolis (France)


Published in SPIE Proceedings Vol. 8443:
Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray
Tadayuki Takahashi; Stephen S. Murray; Jan-Willem A. den Herder, Editor(s)

© SPIE. Terms of Use
Back to Top