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Proceedings Paper

Investigating spectrograph design parameters with the Yale Doppler diagnostic facility
Author(s): Christian Schwab; Thales Gutcke; Julien F. P. Spronck; Debra A Fischer; Andrew Szymkowiak
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Paper Abstract

The detection of earth-like exoplanets with the Doppler technique requires extreme precision spectrographs stable over timescales of years. The precision requirement of 10 cm/s is equivalent to a relative uncertainty of 3x10-10, and, with the typical dispersion of the Echelle spectrographs used for this purpose, translates to a shift of a few nanometers of the spectrum on the detector. Consequently, the instrument must be well understood and optimized in every component and detail. We describe the Yale Doppler diagnostic facility (YDDF), a dedicated bench mounted Echelle spectrograph in our lab at Yale University, which will be used to systematically study the influence of different components at this precision level. The spectrograph bench allows for a flexible optical configuration, high resolution and sampling, and wide spectral coverage. Further, we incorporated a turbulence and guiding simulator to realistically reproduce the situation at the telescope, enabling end-to-end tests of important parameters.

Paper Details

Date Published: 24 September 2012
PDF: 10 pages
Proc. SPIE 8446, Ground-based and Airborne Instrumentation for Astronomy IV, 844695 (24 September 2012); doi: 10.1117/12.926357
Show Author Affiliations
Christian Schwab, Yale Univ. (United States)
Thales Gutcke, Landessternwarte, Zentrum für Astronomie der Univ. Heidelberg (Germany)
Julien F. P. Spronck, Yale Univ. (United States)
Debra A Fischer, Yale Univ. (United States)
Andrew Szymkowiak, Yale Univ. (United States)

Published in SPIE Proceedings Vol. 8446:
Ground-based and Airborne Instrumentation for Astronomy IV
Ian S. McLean; Suzanne K. Ramsay; Hideki Takami, Editor(s)

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